Introduction to Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy (SEM-EDS)
Sunday, March 8, 2026 1:00 PM to 5:00 PM · 4 hr. (America/Chicago)
Short Course Office - Room 211
Short Course
Instrumentation & Nanoscience
Information
If you can see it, you can analyze it! Features at the micro to nano scale as well as the distribution of components can help predict product performance. For this reason, scanning electron microscopes (SEM) are indispensable tools used in research and development, quality inspection and manufacturing across a wide variety of disciplines. This course will provide basic theory and an overview of today’s SEM and EDS technology. Types of SEMs will be discussed and how to choose the right SEM whether imaging at the macro or nano scale. Topics such as resolution (imaging and analytical), imaging detectors, automation, managing non-conductive samples and sample preparation will be touched upon. A variety of applications will be shown in areas such as: battery, additive manufacturing, pharma and nanoparticles etc.
Day of Week
Sunday
Session Number
SC-7363
Application
Instrumentation
Methodology
Surface Analysis/Imaging
Primary Focus
Methodology
Morning or Afternoon
Afternoon
Short Course Information
Course Level
Beginner
Duration
Half Day Course
Learning Objective
This course will provide attendees with an overview of SEM, explain data types collected, and provide real world examples of the usage of the provided data. This technique is particularly useful for investigations of surface characteristics, failure analysis, and material properties.
Course Outline
1. SEM
a. The benefits
b. Types of SEM and Resolution
c. Anatomy of an SEM and how it works
d. High and low vacuum modes
e. Optimization for SEM imaging
f. Misc. Imaging Techniques
2. EDS
a. Basis for X-ray generation in SEM
b. Elements detected and detection limits in SEM-EDS
c. Qualitative and quantitative analysis
d. Optimization and conditions for spectrum and map acquisition
e. Advanced methods
i. Phase
ii. Automation
3. A few Notes on Sample Preparation
Target Audience
The target audience for this short course is wide ranging from scientists with no knowledge of electron microscopy up to moderate users hoping to expand the usefulness of the instrumentation and data collection methodologies of their existing instrumentation.
Early Fee (before Jan 29, 2026)
$450.00
Full Fee (after Jan 29, 2026)
$550.00
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Speakers

Damian Beasock
JEOL USA, INC