Particle Size and Shape Analysis: How to Get the Most Out of Next-Generation Instrumentation

Established measurement techniques may seem unremarkable, but they remain reliable and can integrate latest developments in usability, accuracy, and efficiency. This talk explores the latest innovations in instruments for analyzing particle size and shape, covering scales from nanometers to centimeters. It aims to guide decision-makers and users in selecting technologies that address their challenges while showcasing what state-of-the-art instrumentation offers.
Laser diffraction, established in the 1960s, is a trusted method for particle sizing and Dynamic Light Scattering extends measurements to the low nanoscale. More modern tools like Dynamic Image Analyzers (DIA), made possible by modern digital cameras and computing power, enable rapid shape analysis of millions of particles in minutes.
Key questions on usability, measurement ranges, and balancing data accuracy with outlier detection will be addressed.